| dc.contributor.author |
Akers, Lex Alan |
en_US |
| dc.creator |
Akers, Lex Alan |
en_US |
| dc.date.available |
2011-02-18T19:08:50Z |
en_US |
| dc.date.issued |
1975-08 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/2346/9611 |
en_US |
| dc.description.abstract |
. |
en_US |
| dc.language.iso |
en_US |
en_US |
| dc.publisher |
Texas Tech University |
en_US |
| dc.subject |
Semiconductors |
en_US |
| dc.subject |
Field-effect transistors |
en_US |
| dc.subject |
Electric currents |
en_US |
| dc.title |
The analysis of the steady-state thermal and electrical behavior of a silicon metal-oxide-semiconductor field effect transistor. |
en_US |
| dc.type |
Electronic Dissertation |
en_US |
| dc.degree.department |
Accounting and Information Systems |
en_US |
| dc.degree.discipline |
Accounting and Information Systems |
en_US |
| dc.degree.grantor |
Texas Tech University |
en_US |
| dc.degree.level |
Doctoral |
en_US |
| dc.degree.name |
Ph.D. |
en_US |
| dc.rights.availability |
unrestricted |
en_US |