Correlation Between Optoelectronic and Structural Properties and Epilayer Thickness of AlN

Date

2007-06-11

Authors

Weyburne, David
Paduano, Q.S.
Jiang, H.X.
Lin, J.Y.
Li, J.
Nepal, N.
Nakarmi, M.L.
Dahal, R.
Pantha, B.N.

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Publisher

American Institute of Physics

Abstract

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