Mems atomic force microscope

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dc.contributor.committeeChair Dallas , Tim
dc.contributor.committeeMember Bayne , Stephen Electrical Engineering Electrical Engineering Texas Tech University Masters Master of Science in Electrical Engineering
dc.rights.availability Unrestricted .
dc.creator Kolluru , Surya Kiran K . 2014 -06 -06T20 :11 :55Z 2011 -01 -11T15 :54 :16Z 2014 -06 -06T20 :11 :55Z 2010 -12
dc.identifier.uri http : / /hdl .handle .net /2346 /ETD -TTU -2010 -12 -1197
dc.description.abstract This thesis presents the design , development , and testing MEMS based Atomic Force Microscope (AFM ) . The system is capable of measuring the pull -off force measurements on different surfaces . The design is capable of producing a verticalresolution of ~ 2nm . The MEMS AFM consists of a stand -alone optical head , stepper motor controlled Z stage assembly incorporated with a MEMS XY stage . The shaft end of the stepper motor has a worm gear attached , which takes care of the Z movement .A commercial piezo actuator from Noliacis used . A LabView -based system is used to control the entire assembly . Custom made piezo amplifiers and transimpedance amplifiers are developed . The MEMS -based AFM has significance in finding the adhesion forces of a surface estimating the surface energy present on the surface . Surface forces in the order of ~21Nn and ~ 11nN are measured for a bare silicon substrate and hydrophobic coated MEMS XY stage . In addition , the results obtained are compared with the results of the force measurements performed on a commercial AFM system (Park XE -100 ) . The signal to noise ratio for the system is calculated and is found to be 40 dB .
dc.format.mimetype application /pdf
dc.language.iso eng
dc.subject NA
dc.title Mems atomic force microscope
dc.type Thesis


Mems atomic force microscope. Master's thesis, Texas Tech University. Available electronically from http : / /hdl .handle .net /2346 /ETD -TTU -2010 -12 -1197 .

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