| dc.creator |
Smith , Cartel |
|
| dc.date |
2011 -12 |
|
| dc.date |
2012 -03 -05T15 :16 :08Z |
|
| dc.date |
2012 -06 -01T15 :25 :10Z |
|
| dc.date |
2012 -03 -05T15 :16 :08Z |
|
| dc.date |
2012 -06 -01T15 :25 :10Z |
|
| dc.date |
2011 -12 |
|
| dc.date |
2011 -12 |
|
| dc.date |
2011 -12 -01 |
|
| dc.date.accessioned |
2012 -11 -29T20 :52 :25Z |
|
| dc.date.available |
2012 -11 -29T20 :52 :25Z |
|
| dc.date.issued |
2012 -11 -29 |
|
| dc.identifier |
http : / /hdl .handle .net /2346 /23880 |
|
| dc.identifier.uri |
http : / /hdl .handle .net /2346 /23880 |
|
| dc.description |
This literature begins by introducing the history of reliability and safety engineering . From here , a statistical foundation is laid with an emphasis on the distribution functions that are often associated with this branch of engineering - specifically as it pertains to semiconductor reliability evaluation . This thesis then goes on to examine the more interesting properties of the PLZT material . A broad discussion of the processing flow of a capacitor that utilizes the PLZT dielectric follows . The text then transitions to a reliability analysis of the aforementioned capacitor . Here , thorough descriptions of all accelerated tests are given -including hardware setups . Later , the results of the tests are presented . Finally , this text concludes with a theoretical interpretation of the results from a reliability perspective ; whereby modeling data and acceleration factors are discussed , and an example is given . |
|
| dc.language |
en _US |
|
| dc.rights |
Restricted - embargoed from online display . For access , please contact the author . |
|
| dc.subject |
Semiconductor reliability |
|
| dc.subject |
accelerated testing |
|
| dc.subject |
wafer level reliability |
|
| dc.title |
Accelerated testing of a lanthanum -modified lead zirconate titanate capacitor |
|
| dc.type |
Thesis |
|