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Description:
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This literature begins by introducing the history of reliability and safety engineering . From here , a statistical foundation is laid with an emphasis on the distribution functions that are often associated with this branch of engineering - specifically as it pertains to semiconductor reliability evaluation . This thesis then goes on to examine the more interesting properties of the PLZT material . A broad discussion of the processing flow of a capacitor that utilizes the PLZT dielectric follows . The text then transitions to a reliability analysis of the aforementioned capacitor . Here , thorough descriptions of all accelerated tests are given -including hardware setups . Later , the results of the tests are presented . Finally , this text concludes with a theoretical interpretation of the results from a reliability perspective ; whereby modeling data and acceleration factors are discussed , and an example is given . |