The design and implementation of an automated bench test system

In the semiconductor industry, the number of transistors per integrated circuit is doubling about every 18 months [1]. This rapid increase of technology is driving devices to be smaller and faster and causing the instruments used to test these devices to become more complex, more expensive, and more specialized. The window of opportunity, to get a part to market with a decent market share, is also getting smaller and smaller as semiconductor technology and testing technology continue to develop. This short time span is one of the driving forces behind increased competition between semiconductor companies, and their race to get a part to market first.

The process of bringing a new integrated circuit or chip to market is partially dependent upon labor-intensive and time-consuming testing in the laboratory with individual pieces of equipment, called bench testing. Repetitive bench testing must be done to completely characterize the electrical parameters of a new device. Bench testing can tie up the resources of a company for weeks on end. Bench testing involves taking the DC, AC, and Z-state measurements for each electrical parameter that will be present within the tested device's datasheet. These measurements must be taken numerous times on many devices of the same type, and are, arguably, one of the most time-consuming elements of bringing a part to market. Any process designed to reduce the resources required for such a task becomes inherently valuable. Such a process involves automating as much of the bench testing procedure as possible without restricting the types of testable devices. This thesis discusses the development of a bench automation system designed to perform the repetitive measurements required for a part to reach market with a reduction in the resources needed to complete such a task.