X-ray line width measurements with a three-crystal spectrometer

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dc.creator Welch , Herbert Eugene
dc.date 2011 -02 -18T22 :24 :18Z
dc.date 2012 -06 -01T14 :18 :44Z
dc.date 2011 -02 -18T22 :24 :18Z
dc.date 2012 -06 -01T14 :18 :44Z
dc.date 2011 -02 -18T22 :24 :18Z
dc.date 1969 -01 -01
dc.date.accessioned 2012 -11 -29T19 :40 :37Z
dc.date.available 2012 -11 -29T19 :40 :37Z
dc.date.issued 2012 -11 -29
dc.identifier http : / /hdl .handle .net /2346 /18145
dc.identifier.uri http : / /hdl .handle .net /2346 /18145
dc.description Not available
dc.language en _US
dc.publisher Texas Tech University
dc.rights unrestricted
dc.subject Spectrometer
dc.subject X -ray crystallography
dc.title X -ray line width measurements with a three -crystal spectrometer
dc.type Electronic Dissertation

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X-ray line width measurements with a three-crystal spectrometer. Available electronically from http : / /hdl .handle .net /2346 /18145 .

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