X-ray line width measurements with a three-crystal spectrometer

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dc.degree.department Physics en_US
dc.degree.discipline Physics en_US
dc.degree.grantor Texas Tech University en_US
dc.degree.level Doctoral en_US
dc.degree.name Ph .D . en_US
dc.rights.availability unrestricted en_US
dc.creator Welch , Herbert Eugene en_US
dc.date.accessioned 2014 -02 -19T18 :24 :29Z
dc.date.available 2011 -02 -18T22 :24 :18Z en_US
dc.date.available 2014 -02 -19T18 :24 :29Z
dc.date.issued 1969 -05 en_US
dc.identifier.uri http : / /hdl .handle .net /2346 /18145 en_US
dc.description.abstract Not available en_US
dc.language.iso en _US en_US
dc.publisher Texas Tech University en_US
dc.subject Spectrometer en_US
dc.subject X -ray crystallography en_US
dc.title X -ray line width measurements with a three -crystal spectrometer en_US
dc.type Electronic Dissertation en_US

Citation

X-ray line width measurements with a three-crystal spectrometer. Doctoral dissertation, Texas Tech University. Available electronically from http : / /hdl .handle .net /2346 /18145 .

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