Study of metal films by the method of total reflection of x-rays

Date

1980-05

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Texas Tech University

Abstract

Not available

Description

Keywords

X-rays -- Scattering, Metallic films -- Optical properties, Reflection (Optics)

Citation

URI

http://hdl.handle.net/2346/17946

Collections

Texas Tech University