Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices

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Title: Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices
Author: Ko, Kil-soo
Abstract: Not available
URI: http : / /hdl .handle .net /2152 /709
Date: 2008-08-28

Citation

Characterization of two-dimensional electrostatic potential profiles in deep submicron MOSFET devices. Doctoral dissertation, The University of Texas at Austin. Available electronically from http : / /hdl .handle .net /2152 /709 .

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