Fabrication modeling and reliability of novel architecture and novel materials based MOSFET devices

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Title: Fabrication modeling and reliability of novel architecture and novel materials based MOSFET devices
Author: Dey, Sagnik
Abstract: Not available
URI: http : / /hdl .handle .net /2152 /2714
Date: 2008-08-28

Citation

Fabrication modeling and reliability of novel architecture and novel materials based MOSFET devices. Doctoral dissertation, The University of Texas at Austin. Available electronically from http : / /hdl .handle .net /2152 /2714 .

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