Nonlinear optical characterization of Si/high-k dielectric interfaces

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Title: Nonlinear optical characterization of Si/high-k dielectric interfaces
Author: Carriles Jaimes, Ramón
Abstract: Not available
URI: http : / /hdl .handle .net /2152 /2399
Date: 2008-08-28

Citation

Nonlinear optical characterization of Si/high-k dielectric interfaces. Doctoral dissertation, The University of Texas at Austin. Available electronically from http : / /hdl .handle .net /2152 /2399 .

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