Efficient vlsi yield prediction with consideration of partial correlations

Show simple item record

dc.contributor.advisor Hu , Jiang en_US
dc.contributor.committeeMember Bhattacharyya , Shankar en_US
dc.creator Varadan , Sridhar en_US
dc.date.accessioned 2010 -01 -15T00 :06 :29Z
dc.date.accessioned 2014 -02 -19T19 :31 :43Z
dc.date.available 2010 -01 -15T00 :06 :29Z
dc.date.available 2014 -02 -19T19 :31 :43Z
dc.date.created 2007 -12 en_US
dc.date.issued 2009 -05 -15 en_US
dc.identifier.uri http : / /hdl .handle .net /1969 .1 /ETD -TAMU -2503
dc.description.abstract With the emergence of the deep submicron era , process variations have gained importance in issues related to chip design . The impact of process variations is measured using manufacturing /parametric yield . In order to get an accurate estimate of yield , the parameters considered need to be monitored at a large number of locations . Nowadays , intra -die variations are an integral part of the overall process uctuations . This leads to the difficult case where yield prediction has to be done while considering independent and partially correlated variations . The presence of partial correlations adds to the existing trouble caused by the volume of variables . This thesis proposes two techniques for reducing the number of variables and hence the complexity of the yield computation problem namely - Principal Component Analysis (PCA ) and Hierarchical Adaptive Quadrisection (HAQ ) . Systematic process variations are also included in our yield model . The biggest plus in these two methods is reducing the size of the yield prediction problem (thus making it less time complex ) without affecting the accuracy in yield . The efficiency of these two approaches is measured by comparing with the results obtained from Monte Carlo simulations . Compared to previous work , the PCA based method can reduce the error in yield estimation from 17 .1 % - 21 .1 % to 1 .3 % - 2 .8 % with 4 .6x speedup . The HAQ technique can reduce the error to 4 .1 % - 5 .6 % with 6x - 9 .4x speedup . en_US
dc.format.medium electronic en_US
dc.format.mimetype application /pdf en_US
dc.language.iso en _US en_US
dc.subject Yield en_US
dc.title Efficient vlsi yield prediction with consideration of partial correlations en_US
dc.type Book en
dc.type.genre Electronic Thesis en_US
dc.type.material text en_US
dc.format.digitalOrigin born digital en_US


Efficient vlsi yield prediction with consideration of partial correlations. Available electronically from http : / /hdl .handle .net /1969 .1 /ETD -TAMU -2503 .

Files in this item

Files Size Format View

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

Search DSpace

Advanced Search