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Description:
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IDDQ testing is one of the most effective methods for detecting defects in integrated
circuits . Higher leakage currents in more advanced semiconductor technologies have
reduced the resolution of IDDQ test . One solution is to use built -in current sensors . Several
sensor techniques for measuring the current based on the magnetic field or voltage drop
across the supply line have been proposed . In this work , we develop a behavioral model
for a built -in current sensor measuring voltage drop and use this model to better
understand sensor operation , identify the effect of different parameters on sensor
resolution , and suggest design modifications to improve future sensor performance . |