A Behavioral Model of a Built-in Current Sensor for IDDQ Testing

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Title: A Behavioral Model of a Built-in Current Sensor for IDDQ Testing
Author: Gharaibeh, Ammar
Abstract: IDDQ testing is one of the most effective methods for detecting defects in integrated circuits . Higher leakage currents in more advanced semiconductor technologies have reduced the resolution of IDDQ test . One solution is to use built -in current sensors . Several sensor techniques for measuring the current based on the magnetic field or voltage drop across the supply line have been proposed . In this work , we develop a behavioral model for a built -in current sensor measuring voltage drop and use this model to better understand sensor operation , identify the effect of different parameters on sensor resolution , and suggest design modifications to improve future sensor performance .
URI: http : / /hdl .handle .net /1969 .1 /ETD -TAMU -2009 -08 -7097
Date: 2010-01-14

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A Behavioral Model of a Built-in Current Sensor for IDDQ Testing. Available electronically from http : / /hdl .handle .net /1969 .1 /ETD -TAMU -2009 -08 -7097 .

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