Bayesian Hierarchical Model for Combining Two-resolution Metrology Data

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Title: Bayesian Hierarchical Model for Combining Two-resolution Metrology Data
Author: Xia, Haifeng
Abstract: This dissertation presents a Bayesian hierarchical model to combine two -resolution metrology data for inspecting the geometric quality of manufactured parts . The high - resolution data points are scarce , and thus scatter over the surface being measured , while the low -resolution data are pervasive , but less accurate or less precise . Combining the two datasets could supposedly make a better prediction of the geometric surface of a manufactured part than using a single dataset . One challenge in combining the metrology datasets is the misalignment which exists between the low - and high -resolution data points . This dissertation attempts to provide a Bayesian hierarchical model that can handle such misaligned datasets , and includes the following components : (a ) a Gaussian process for modeling metrology data at the low -resolution level ; (b ) a heuristic matching and alignment method that produces a pool of candidate matches and transformations between the two datasets ; (c ) a linkage model , conditioned on a given match and its associated transformation , that connects a high -resolution data point to a set of low -resolution data points in its neighborhood and makes a combined prediction ; and finally (d ) Bayesian model averaging of the predictive models in (c ) over the pool of candidate matches found in (b ) . This Bayesian model averaging procedure assigns weights to different matches according to how much they support the observed data , and then produces the final combined prediction of the surface based on the data of both resolutions . The proposed method improves upon the methods of using a single dataset as well as a combined prediction without addressing the misalignment problem . This dissertation demonstrates the improvements over alternative methods using both simulated data and the datasets from a milled sine -wave part , measured by two coordinate measuring machines of different resolutions , respectively .
URI: http : / /hdl .handle .net /1969 .1 /ETD -TAMU -2008 -12 -164
Date: 2010-01-14

Citation

Bayesian Hierarchical Model for Combining Two-resolution Metrology Data. Available electronically from http : / /hdl .handle .net /1969 .1 /ETD -TAMU -2008 -12 -164 .

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