Surface spectroscopic characterization of oxide thin films and bimetallic model catalysts

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Title: Surface spectroscopic characterization of oxide thin films and bimetallic model catalysts
Author: Wei, Tao
Abstract: Oxide thin films and bimetallic model catalysts have been studied using metastable impact electron spectroscopy (MIES ) , ultraviolet photoelectron spectroscopy (UPS ) , low energy ion scattering spectroscopy (LEISS ) , X ? ray photoelectron spectroscopy (XPS ) , low energy electron diffraction (LEED ) , infrared reflection absorption spectroscopy (IRAS ) and temperature programmed desorption (TPD ) under ultra high vacuum (UHV ) conditions . Of particular interest in this investigation was the characterization of the surface morphology and electronic /geometric structure of the following catalysts : SiO2 /Mo (112 ) , Ag /SiO2 /Mo (112 ) , Au ?Pd /Mo (110 ) , Au ?Pd /SiO2 /Mo (110 ) , and Pd ? Sn /Rh (100 ) . Specifically , different types of oxide surface defects were directly identified by MIES . The interaction of metal clusters (Ag ) with defects was examined by work function measurements . On various Pd related bimetallic alloy surfaces , CO chemisorption behavior was addressed by IRAS and TPD . Observed changes in the surface chemical properties during the CO adsorption -desorption processes were explained in terms of ensemble and ligand effects . The prospects of translating this molecular -level information into fundamental understanding of ?real world ? catalysts are discussed .
URI: http : / /hdl .handle .net /1969 .1 /ETD -TAMU -1058
Date: 2009-05-15

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Surface spectroscopic characterization of oxide thin films and bimetallic model catalysts. Available electronically from http : / /hdl .handle .net /1969 .1 /ETD -TAMU -1058 .

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