Nanoscale characterization of solution-cast poly(vinylidene fluoride) thinfilms using atomic force microscopy

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Title: Nanoscale characterization of solution-cast poly(vinylidene fluoride) thinfilms using atomic force microscopy
Author: Jee, Tae Kwon
Abstract: This thesis research focuses on the characterization of thinfilms made of poly (vinylidene fluoride ) (PVDF ) using an atomic force microscope . Thinfilms of PVDF were fabricated by a spin coating method with different conditions and characterized using the Atomic Force Microscopy (AFM ) for morphological changes . Phase and conformational changes of PVDF were investigated using both wide angle X -ray diffraction (WAXD ) and Fourier Transform Infrared Spectroscopy (FTIR ) . From this analysis , in -situ corona poling with annealing of spin -cast PVDF enabled a phase change from ? ? ? ? to the mixture of ? ? ? ? and ? ? ? ? phases . This process can decrease the complexity of the conventional method which requires mechanical stretching before poling PVDF in addition to thermal annealing for ? ? ? ? phase transformation . This thesis describes some materials and surface properties of solution -cast PVDF thinfilms with various conditions such as topography and phase image , adhesion force , friction force , and roughness . Through the AFM topography and phase images , polymeric behavior and spherulites are discussed in the later part of the thesis .
URI: http : / /hdl .handle .net /1969 .1 /4790
Date: 2007-04-25

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Nanoscale characterization of solution-cast poly(vinylidene fluoride) thinfilms using atomic force microscopy. Available electronically from http : / /hdl .handle .net /1969 .1 /4790 .

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