Approaches to test set generation using binary decision diagrams

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dc.contributor.advisor Mercer , M . Ray en_US
dc.contributor.committeeMember Grimaila , Michael en_US
dc.creator Wingfield , James en_US
dc.date.accessioned 2004 -09 -30T01 :40 :20Z
dc.date.accessioned 2014 -02 -18T22 :28 :02Z
dc.date.available 2004 -09 -30T01 :40 :20Z
dc.date.available 2014 -02 -18T22 :28 :02Z
dc.date.created 2003 -12 en_US
dc.date.issued 2004 -09 -30T01 :40 :20Z
dc.identifier.uri http : / /hdl .handle .net /1969 .1 /20
dc.description.abstract This research pursues the use of powerful BDD -based functional circuit analysis to evaluate some approaches to test set generation . Functional representations of the circuit allow the measurement of information about faults that is not directly available through circuit simulation methods , such as probability of random detection and test -space overlap between faults . I have created a software tool that performs experiments to make such measurements and augments existing test generation strategies with this new information . Using this tool , I explored the relationship of fault model difficulty to test set length through fortuitous detection , and I experimented with the application of function -based methods to help reconcile the traditionally opposed goals of making test sets that are both smaller and more effective . en_US
dc.format.extent 261635 bytes
dc.format.medium electronic en_US
dc.format.mimetype application /pdf
dc.language.iso en _US en_US
dc.publisher Texas A &M University en_US
dc.subject binary decision diagram en_US
dc.title Approaches to test set generation using binary decision diagrams en_US
dc.type Book en
dc.type.genre Electronic Thesis en_US
dc.type.material text en_US
dc.format.digitalOrigin born digital en_US

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Approaches to test set generation using binary decision diagrams. Available electronically from http : / /hdl .handle .net /1969 .1 /20 .

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