Approaches to test set generation using binary decision diagrams

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Title: Approaches to test set generation using binary decision diagrams
Author: Wingfield, James
Abstract: This research pursues the use of powerful BDD -based functional circuit analysis to evaluate some approaches to test set generation . Functional representations of the circuit allow the measurement of information about faults that is not directly available through circuit simulation methods , such as probability of random detection and test -space overlap between faults . I have created a software tool that performs experiments to make such measurements and augments existing test generation strategies with this new information . Using this tool , I explored the relationship of fault model difficulty to test set length through fortuitous detection , and I experimented with the application of function -based methods to help reconcile the traditionally opposed goals of making test sets that are both smaller and more effective .
URI: http : / /hdl .handle .net /1969 .1 /20
Date: 2004-09-30

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Approaches to test set generation using binary decision diagrams. Available electronically from http : / /hdl .handle .net /1969 .1 /20 .

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