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Description:
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This research pursues the use of powerful BDD -based functional circuit analysis to evaluate some approaches to test set generation . Functional representations of the circuit allow the measurement of information about faults that is not directly available through circuit simulation methods , such as probability of random detection and test -space overlap between faults . I have created a software tool that performs experiments to make such measurements and augments existing test generation strategies with this new information . Using this tool , I explored the relationship of fault model difficulty to test set length through fortuitous detection , and I experimented with the application of function -based methods to help reconcile the traditionally opposed goals of making test sets that are both smaller and more effective . |